R. Difrenza

A comparison of extraction techniques for threshold voltage mismatch

J.A. Croon, Hans Tuinhout, R. Difrenza et al. · 2003 · 45 citations

Low-power Electronics, Electrical Engineering, Engineering +9

Impact of grain number fluctuations in the MOS transistor gate on matching performance

R. Difrenza, J.C. Vildeuil, P. Llinarès et al. · 2003 · 26 citations

Device Modeling, Electrical Engineering, Engineering +13

Low cost 65nm CMOS platform for Low Power & General Purpose applications

F. Arnaud, B. Duriez, B. Tavel et al. · 2004 · 24 citations

Low-power Electronics, Low Power, Electrical Engineering +10

The impact of short channel and quantum effects on the MOS transistor mismatch

R. Difrenza, P. Llinarès, G. Ghibaudo · Solid-State Electronics · 2003 · 20 citations

Mos Transistor Mismatch, Quantum Science, Electrical Engineering +9

Impact of pocket implant on MOSFET mismatch for advanced CMOS technology

J. Mc Ginley, O. Noblanc, C. Julien et al. · 2004 · 19 citations

Pocket Implant, Electrical Engineering, Semiconductor Device +13