J.A. Croon

An easy-to-use mismatch model for the MOS transistor

J.A. Croon, M. Rosmeulen, Stefaan Decoutere et al. · IEEE Journal of Solid-State Circuits · 2002 · 137 citations

Device Modeling, Physics-based Mismatch Model, Electrical Engineering +14

Intentionally Carbon-Doped AlGaN/GaN HEMTs: Necessity for Vertical Leakage Paths

Michael J. Uren, Marco Silvestri, Markus Cäsar et al. · IEEE Electron Device Letters · 2014 · 123 citations · Full text

Semiconductors, High Density, Electrical Engineering +12

Line edge roughness: characterization, modeling and impact on device behavior

J.A. Croon, Gert Storms, Stephanie Winkelmeier et al. · 2003 · 107 citations

Device Modeling, Electrical Engineering, Engineering +9

Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield

T.S. Doorn, E. Jan W. ter Maten, J.A. Croon et al. · 2008 · 75 citations

Engineering, Computer Architecture, Monte Carlo Methods +20

CMOS device optimization for mixed-signal technologies

P.A. Stolk, Hans Tuinhout, Ray Duffy et al. · 2002 · 58 citations

Electrical Engineering, Engineering, Vlsi Design +12