Statistics
Publications
7
Citations
359
H-Index
7
Active since
2005
Affiliations
T.S. Doorn is an author at NXP (Netherlands) specializing in engineering, electrical engineering, and microelectronics.
Publications per year
2005–2015
7
7
Importance sampling Monte Carlo simulations for accurate estimation of SRAM yield
T.S. Doorn, E. Jan W. ter Maten, J.A. Croon et al. · 2008 · 77 citations · Full text
Mohammad Shawkat Zaman, Yue Wen, Ryan Fernandes et al. · IEEE Transactions on Power Electronics · 2015 · 49 citations · Full text
Module-level DC/DC conversion for photovoltaic systems
Henk Jan Bergveld, D. Buthker, C. Castello et al. · 2011 · 30 citations
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