The channeling effect of Al and N ion implantation in 4H–SiC during JFET integrated device processing

M. Lazar, Farah Laariedh, Pierre Crémillieu, Dominique Planson, Jean‐Louis Leclercq

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2015 · 16 citations · 7 references

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