Microelectronics Reliability · 2025 · 20 citations · 43 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsNanotechnologySemiconductor DevicesDevice CharacterizationDevice ReliabilityField-effect TransistorsMetal-oxide-semiconductor Field-effect TransistorsNanowiresSemiconductor ReliabilityCharge Trapping ReliabilityInterface Trap DensityInterface Trap ModelingInterface Trap ReductionInterface Trap StatesNanowire DevicesNanowire Field-effect TransistorsNanowire Transistors
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MoS<sub>2</sub> Transistors Operating at Gigahertz Frequencies
Daria Krasnozhon, Dominik Lembke, Clemens Nyffeler et al. · Nano Letters · 2014 · 185 citations · Full text
InAs–Si Nanowire Heterojunction Tunnel FETs
Kirsten E. Moselund, Heinz Schmid, Cedric Bessire et al. · IEEE Electron Device Letters · 2012 · 139 citations · Full text