Effect of Positive/Negative Interface Trap Charges on the Performance of Multi Fin FinFET (M-FinFET)

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Short-channel effects in SOI MOSFETs

S. Veeraraghavan, J.G. Fossum · IEEE Transactions on Electron Devices · 1989 · 304 citations

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FinFETs: From Devices to Architectures

Debajit Bhattacharya, Niraj K. Jha · Advances in Electronics · 2014 · 208 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +17

Investigation of the Novel Attributes of a Fully Depleted Dual-Material Gate SOI MOSFET

Anurag Chaudhry, M. Jagadesh Kumar · IEEE Transactions on Electron Devices · 2004 · 142 citations

Engineering, Electrical Engineering, Materials Science +17