Characterization of various FinFET based 6T SRAM cell configurations in light of radiation effect

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FinFETs: From Devices to Architectures

Debajit Bhattacharya, Niraj K. Jha · Advances in Electronics · 2014 · 208 citations · Full text

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Effect of Multiple-Transistor Charge Collection on Single-Event Transient Pulse Widths

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Threshold Voltage Sensitivity to Metal Gate Work-Function Based Performance Evaluation of Double-Gate n-FinFET Structures for LSTP Technology

Mohd Amrallah Mustafa, Tawseef Ahmad Bhat, M. Rafiq Beigh · World Journal of Nano Science and Engineering · 2013 · 41 citations · Full text

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Static-Noise-Margin Analysis of Conventional 6T SRAM Cell at 45nm Technology

Nahid Rahman, B. P. Singh · 2013 · 39 citations

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