Simplified SEE Sensitivity Screening for COTS Components in Space

Abstract

We introduce an approach aimed at prescreening COTS components according to their single-event effect (SEE) sensitivity for space missions in which a complete characterization of their individual response to protons and heavy ions is not feasible due to cost and time constraints. The method is applied to a set of SRAM memories for single-event upset (SEU) and single-event latchup (SEL) and the resulting expected SEE rates are compared with traditional approaches and in-flight data for a low-earth orbit polar and a geostationary orbit. Despite the limitations related to components with high-LET threshold and thick sensitive volumes, we conclude that the proposed method can be an efficient means of rejecting highly sensitive components or lots and performing the complete characterization only on passing devices.