Concepedia

Radiation-induced Error Mitigation

Radiation-Induced Error Mitigation is a hardware fault tolerance technique that specifically addresses errors caused by ionizing radiation in electronic systems by employing design strategies to detect, correct, or prevent such radiation-induced faults.

204

Publications

11.2K

Citations

636

Authors

201

Institutions

Publications per year

2017–2026

50

Parents

Publications

204

The Sorcerer's Apprentice Guide to Fault Attacks

Hagai Bar-El, Hamid Choukri, David Naccache et al. · Proceedings of the IEEE · 2006 · 723 citations

, , +15

Robust system design with built-in soft-error resilience

Subhasish Mitra, N. Seifert, M. Zhang et al. · Computer · 2005 · 562 citations

, , +17

The Soft Error Problem: An Architectural Perspective

S. Mukherjee, Joel Emer, S.K. Reinhardt · 2005 · 450 citations

, , +16

Soft errors in advanced semiconductor devices-part I: the three radiation sources

R. Baumann · IEEE Transactions on Device and Materials Reliability · 2001 · 405 citations

, , +16

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2006 · 398 citations

, , +11

1–5 of 204

Authors

636

  1. MW
    Michael Wirthlin

    Brigham Young University, United States

    17 publications · 620 citations

    14

    h-index

  2. NS
    N. Seifert

    Intel (United States), United States

    11 publications · 1.5K citations

    11

    h-index

  3. BL
    B. L. Bhuva

    Vanderbilt University, United States

    9 publications · 761 citations

    9

    h-index

  4. HQ
    Heather Quinn

    Los Alamos National Laboratory, United States

    9 publications · 432 citations

    9

    h-index

  5. LW
    L. W. Massengill

    Vanderbilt University, United States

    9 publications · 719 citations

    9

    h-index

1–5 of 636

Institutions

201

  1. Universidade Federal do Rio Grande do Sul

    Porto Alegre, Brazil

    13 h-index

    45 publications

    1.2K citations

  2. Brigham Young University

    Provo, United States

    12 h-index

    38 publications

    1.3K citations

  3. Intel (United States)

    Santa Clara, United States

    12 h-index

    57 publications

    9.4K citations

  4. Vanderbilt University

    Nashville, United States

    12 h-index

    74 publications

    6.3K citations

  5. Los Alamos National Laboratory

    Los Alamos, United States

    11 h-index

    29 publications

    1.7K citations

  6. European Organization for Nuclear Research

    Geneva, Switzerland

    9 h-index

    37 publications

    850 citations

  7. The Aerospace Corporation

    El Segundo, United States

    7 h-index

    26 publications

    2K citations

  8. United States Naval Research Laboratory

    Washington, United States

    6 h-index

    17 publications

    498 citations

1–8 of 201

Venues

  1. IEEE Transactions on Nuclear Science

    61 publications · 3.2K citations

    33

    h-index

  2. 7

    h-index

  3. Microelectronics Reliability

    4 publications · 106 citations

    4

    h-index

  4. 3

    h-index

  5. 3

    h-index

1–5