Component-level Radiation Testing
Component-Level Radiation Testing is a systematic experimental methodology within radiation hardening that evaluates the susceptibility and performance degradation of individual electronic components when exposed to ionizing radiation, distinguishing itself by focusing on discrete hardware elements rather than integrated systems or materials.
149
Publications
4.5K
Citations
607
Authors
175
Institutions
Publications per year
2017–2026
20
Parents
149
1–5 of 149
607
13
h-index
12
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11
h-index
9
h-index
8
h-index
1–5 of 607
175
Jet Propulsion Laboratory
Pasadena, United States
15 h-index
55 publications
1.4K citations
Goddard Space Flight Center
Greenbelt, United States
13 h-index
84 publications
1.5K citations

European Space Research and Technology Centre
Noordwijk-Binnen, The Netherlands
11 h-index
30 publications
700 citations

European Organization for Nuclear Research
Geneva, Switzerland
9 h-index
35 publications
1.7K citations
MEI Technologies (United States)
Houston, United States
8 h-index
39 publications
708 citations
National Research Nuclear University MEPhI
Moscow, Russia
7 h-index
24 publications
623 citations

Centre National de la Recherche Scientifique
Paris, France
7 h-index
10 publications
212 citations
California Institute of Technology
Pasadena, United States
7 h-index
20 publications
603 citations
1–8 of 175
40 publications · 1.3K citations
19
h-index
Repository · 3 publications · 62 citations
3
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2 publications · 53 citations
2
h-index
2 publications · 474 citations
2
h-index
2 publications · 43 citations
2
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1–5