Component-level Radiation Testing

Component-Level Radiation Testing is a systematic experimental methodology within radiation hardening that evaluates the susceptibility and performance degradation of individual electronic components when exposed to ionizing radiation, distinguishing itself by focusing on discrete hardware elements rather than integrated systems or materials.

149

Publications

4.5K

Citations

607

Authors

175

Institutions

Publications per year

2017–2026

20

Authors

607

  1. KA
    Kenneth A. LaBel

    Goddard Space Flight Center, United States

    18 publications · 324 citations

    13

    h-index

  2. MV
    Martha V. O'Bryan

    Goddard Space Flight Center, United States

    13 publications · 241 citations

    12

    h-index

  3. PW
    Paul W. Marshall

    Goddard Space Flight Center, United States

    12 publications · 229 citations

    11

    h-index

  4. MJ
    Michael J. Campola

    Goddard Space Flight Center, United States

    8 publications · 118 citations

    9

    h-index

  5. MD
    Melanie D. Berg

    Goddard Space Flight Center, United States

    8 publications · 137 citations

    8

    h-index

1–5 of 607

Venues

  1. IEEE Transactions on Nuclear Science

    40 publications · 1.3K citations

    19

    h-index

  2. CERN Document Server (European Organization for Nuclear Research)

    Repository · 3 publications · 62 citations

    3

    h-index

  3. 2

    h-index

  4. IBM Journal of Research and Development

    2 publications · 474 citations

    2

    h-index

  5. Fusion Engineering and Design

    2 publications · 43 citations

    2

    h-index

1–5