P. C. Murley - Concepedia

Concepedia

Author

P. C. Murley

IBM (United States)

Also Known As

P. C. Murley, P.C. Murley, Philip C. Murley

24

Publications

1.3K

Citations

16

H-Index

57

Concepts

All Affiliations

IBM (United States)Poughkeepsie Public Library District

PC

About

P. C. Murley is an author at IBM (United States) specializing in engineering, microelectronics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	16	16	1.3K
2	Applied Physics	12	12	944
3	Natural Sciences	7	7	349
4	Education	1	1	22
5	Chemistry	1	1	36

P. C. Murley

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16

Publications

1.3K

Citations

16

H-Index

	Year	Citations
A field-funneling effect on the collection of alpha-particle-generated carriers in silicon devices C. M. Hsieh, P. C. Murley, R. R. O’Brien IEEE Electron Device Letters Alpha-particle-generated CarriersEngineeringAlpha Particle PenetrationSilicon On InsulatorCharge Transport	1981	315
On the Measurement of Impurity Atom Distributions in Silicon by the Differential Capacitance Technique David P. Kennedy, P. C. Murley, W. Kleinfelder IBM Journal of Research and Development Impurity AtomsElectrical EngineeringImpurity Atom DistributionEngineeringPhysics	1968	178
Collection of charge from alpha-particle tracks in silicon devices Chang-Ming Hsieh, P. C. Murley, R. R. O’Brien IEEE Transactions on Electron Devices Device ModelingElectrical EngineeringSemiconductor DeviceEngineeringPhysics	1983	132
Soft-error Monte Carlo modeling program, SEMM P. C. Murley, G. R. Srinivasan IBM Journal of Research and Development Numerical AnalysisEngineeringNuclear PhysicsMonte Carlo MethodsComputer Architecture	1996	128
Accurate, predictive modeling of soft error rate due to cosmic rays and chip alpha radiation G. R. Srinivasan, P. C. Murley, He Tang EngineeringNuclear PhysicsTerrestrial Cosmic RaysReliability EngineeringNumerical Simulation	1994	114
Dynamics of Charge Collection from Alpha-Particle Tracks in Integrated Circuits C. M. Hsieh, P. C. Murley, R. R. O’Brien Reliability physics Semiconductor TechnologyElectrical EngineeringEngineeringPhysicsNatural Sciences	1981	86
Steady State Mathematical Theory for the Insulated Gate Field Effect Transistor David P. Kennedy, P. C. Murley IBM Journal of Research and Development Device ModelingElectrical EngineeringConventional TheoryEngineeringSemiconductor Device	1973	55
Parameter-free, predictive modeling of single event upsets due to protons, neutrons, and pions in terrestrial cosmic rays G. R. Srinivasan, He Tang, P. C. Murley IEEE Transactions on Nuclear Science EngineeringNuclear PhysicsSpace EnvironmentNuclear DataSoft Error Hardness	1994	54
Concentration dependent diffusion of arsenic in silicon David P. Kennedy, P. C. Murley Proceedings of the IEEE Ion ImplantationEngineeringDiffusion ResistancePhysicsConcentration Dependent Diffusion	1971	36
A Two-Dimensional Mathematical Analysis of the Diffused Semiconductor Resistor David P. Kennedy, P. C. Murley IBM Journal of Research and Development EngineeringDiffused Semiconductor ResistorTwo-dimensional Mathematical AnalysisSemiconductor DeviceResistor	1968	31

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