W. Kleinfelder

On the Measurement of Impurity Atom Distributions in Silicon by the Differential Capacitance Technique

David P. Kennedy, P. C. Murley, W. Kleinfelder · IBM Journal of Research and Development · 1968 · 178 citations

Engineering, Electrical Engineering, Materials Science +17

Impurity distribution profiles in ion-implanted silicon

W. Kleinfelder, William S. Johnson, J. F. Gibbons · Canadian Journal of Physics · 1968 · 43 citations

Engineering, Materials Engineering, Materials Science +17

Experimental Evaluation of High Energy Ion Implantation Gradients for Possible Fabrication of a Transistor Pedestal Collector

J. F. Ziegler, B. L. Crowder, W. Kleinfelder · IBM Journal of Research and Development · 1971 · 26 citations

Engineering, Electrical Engineering, Microelectronics +9

Techniques for Improving Engineering Productivity of VLSI Designs

Joseph C. Logue, W. Kleinfelder, Paul Lowy et al. · IBM Journal of Research and Development · 1981 · 16 citations

Engineering, Computer Engineering, Electrical Engineering +16

A hierarchical approach to digital design using computer-aided design and hardware description languages

W. Kleinfelder, Denis Gray, G. Dudevoir · 2003 · 10 citations

Engineering, Digital Design, Electrical Engineering +17