C. M. Hsieh

A field-funneling effect on the collection of alpha-particle-generated carriers in silicon devices

C. M. Hsieh, P. C. Murley, R. R. O’Brien · IEEE Electron Device Letters · 1981 · 315 citations

Alpha-particle-generated Carriers, Engineering, Alpha Particle Penetration +16

Dynamics of Charge Collection from Alpha-Particle Tracks in Integrated Circuits

C. M. Hsieh, P. C. Murley, R. R. O’Brien · Reliability physics · 1981 · 86 citations

Semiconductor Technology, Electrical Engineering, Engineering +13

A rutherford scattering study of the diffusion of heavy metal impurities in silicon to ion-damaged surface layers

T.M. Buck, J. M. Poate, K.A. Pickar et al. · Surface Science · 1973 · 48 citations

Materials Science, Ion-damaged Surface Layers, Ion Implantation +9

Nucleation and growth of stacking faults in epitaxial silicon during thermal oxidation

C. M. Hsieh, D. M. Maher · Journal of Applied Physics · 1973 · 35 citations · Full text

Materials Science, Frank Dislocation, Engineering +15

Ion-implantation-damage gettering effect in silicon photodiode array camera target

C. M. Hsieh, Jay Mathews, H. Seidel et al. · Applied Physics Letters · 1973 · 33 citations

Semiconductors, Materials Science, Electrical Engineering +15