Study of phase separation in an InGaN alloy by electron energy loss spectroscopy in an aberration corrected monochromated scanning transmission electron microscope

<i>Electron Energy-Loss Spectroscopy in the Electron Microscope</i>

R.F. Egerton, Dale E. Newbury · Physics Today · 1987 · 3.4K citations

Natural Sciences, Physics, Analytical Chemistry +11

Solid phase immiscibility in GaInN

I. H. Ho, G. B. Stringfellow · Applied Physics Letters · 1996 · 1K citations

Natural Sciences, Materials Science, Physics +17

Phase separation in InGaN thick films and formation of InGaN/GaN double heterostructures in the entire alloy composition

R. Singh, D. Doppalapudi, T. D. Moustakas et al. · Applied Physics Letters · 1997 · 486 citations

Natural Sciences, Materials Engineering, Materials Science +17

Electron-beam-induced strain within InGaN quantum wells: False indium “cluster” detection in the transmission electron microscope

T. M. Smeeton, Menno J. Kappers, J. S. Barnard et al. · Applied Physics Letters · 2003 · 260 citations · Full text

Natural Sciences, Materials Science, Physics +17

Wide-gap semiconductor InGaN and InGaAln grown by MOVPE

Takashi Matsuoka, Naoto Yoshimoto, T. Sasaki et al. · Journal of Electronic Materials · 1992 · 254 citations

Engineering, Materials Engineering, Materials Science +12