R.F. Egerton - Concepedia

Author

R.F. Egerton

Also Known As

Del Nebot, Egerton, R. F., J. Alejandro Marin C, R Egerton, R F Egerton, R. Egerton, R. F. EGERTON, R. F. Egerton, R.F Egerton, R.F. Egerton

279

Publications

19.5K

Citations

H-Index

153

Concepts

All Affiliations

University of Alberta National Institute for Nanotechnology Brookhaven National Laboratory

About

R.F. Egerton is an author at University of Alberta specializing in engineering, physics, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	39	77	9.1K
2	Natural Sciences	27	38	8.2K
3	Medicine	6	6	273
4	Health Sciences	4	4	339
5	Education	2	2	62

R.F. Egerton

110

Publications

11.9K

Citations

H-Index

Page 1

	Year	Citations
<i>Electron Energy-Loss Spectroscopy in the Electron Microscope</i> R.F. Egerton, Dale E. Newbury Physics Today EngineeringElectron MicroscopyPhysicsMicroscopyNatural Sciences	1987	3.4K
EELS log‐ratio technique for specimen‐thickness measurement in the TEM T. Malis, Shangcong Cheng, R.F. Egerton Journal of Electron Microscopy Technique EngineeringMeasurementMicroscopyElectron DiffractionTransmission Microscope Specimen	1988	881
Electron energy-loss spectroscopy in the TEM R.F. Egerton Reports on Progress in Physics EngineeringMicroscopyElectron DiffractionElectronic PropertiesElectronic Structure	2008	773
Vibrational spectroscopy in the electron microscope Ondrej L. Krivanek, Tracy C. Lovejoy, Niklas Dellby, Nature Electron MicroscopyPhysicsElectron SpectroscopyNatural SciencesSpectroscopy	2014	715
Electron energy-loss spectroscopy R.F. Egerton Physics World Solid SamplesEngineeringAtomic Emission SpectroscopyMicroscopyElectron Diffraction	1997	437
Control of radiation damage in the TEM R.F. Egerton Ultramicroscopy PhysicsRadiation EffectRadiation DamageRadiation EffectsRadiation Protection	2012	336
Mechanisms of radiation damage in beam‐sensitive specimens, for TEM accelerating voltages between 10 and 300 kV R.F. Egerton Microscopy Research and Technique Cross SectionEngineeringRadiation PhysicsRadiation EffectRadiation Exposure	2012	287
Basic questions related to electron-induced sputtering in the TEM R.F. Egerton, Robert R. McLeod, F. Wang, Ultramicroscopy PhysicsElectron SpectroscopyApplied PhysicsElectron DiffractionElectron-induced Sputtering	2009	265
A Novel Two-Step Silica-Coating Process for Engineering Magnetic Nanocomposites Qingxia Liu, Zhenghe Xu, J.A. Finch, Chemistry of Materials Magnetic PropertiesEngineeringChemistryMagnetic MaterialsSol-gel Synthesis	1998	248
Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy R.F. Egerton Ultramicroscopy EngineeringPhysicsElectron SpectroscopyNatural SciencesSpectroscopy	2007	194

Page 1