IEEE Electron Device Letters · 2016 · 12 citations · 10 references
EngineeringChemistryPhosphate DetectionChemical EngineeringNanoelectronicsNanosensorUltrasensitive DetectionCation SensingChemical SensorUltra-high SensitivityElectrical EngineeringAluminum Gallium NitrideMolecular ImprintingMicroelectronicsCategoryiii-v SemiconductorApplied PhysicsGan Power DeviceAlinn/gan SensorFunctional Materials
In this letter, a first study on phosphate detection based on AlInN/GaN high electron mobility transistors (HEMTs) is presented. The ungated regions of GaN HEMT-based sensors were functionalized with the phosphate ion-imprinted polymer and their sensing behaviors were analyzed by detecting different concentrations of phosphate solutions. The results show that the AlInN/GaN sensor exhibits an ultrasensitive response and a specific recognition to phosphate anion and reaches a detection limit below 0.02 mg/L level, which is much lower than the limited indicator level of 0.1 mg/L for the plankton growth, while the AlInN/GaN sensor shows a higher sensitivity to phosphate anion when compared with the AlGaN/GaN sensor. This ultra-high sensitivity is attributed to the use of thinner barrier layer in the AlInN/GaN heterostructure, which makes 2-D electron gas channel more sensitive to the change of surface charge.
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Barrier-Layer Scaling of InAlN/GaN HEMTs
Farid Medjdoub, M. Alomari, J.‐F. Carlin et al. · IEEE Electron Device Letters · 2008 · 113 citations · Full text
Semiconductors, Semiconductor Technology, Electrical Engineering +14