Journal of Computational Electronics · 2016 · 26 citations · 25 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesComplementary Metal-oxide-semiconductor TechnologyDevice ModelingDevice SimulationIntegrated Circuit DesignMetal-oxide-semiconductor Field-effect TransistorsSemiconductor PhysicsGate-dependent Current-voltage BehaviorMetal-oxide-semiconductor Field-effect Transistor Small-signal ModelsMosfet ModelingSubthreshold Conduction ModelingSubthreshold SwingSubthreshold Swing AnalysisSubthreshold Swing Degradation
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Device scaling limits of Si MOSFETs and their application dependencies
D.J. Frank, R.H. Dennard, E. Nowak et al. · Proceedings of the IEEE · 2001 · 1.6K citations
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Jean-Pierre Colinge · Solid-State Electronics · 2004 · 936 citations