Using Permanent and Temporary Polyimide Adhesives in 3D-TSV Processing To Avoid Thin Wafer Handling

Mel Zussman, Chris Milasincic, Anthony Rardin, Simon Kirk, T. Itabshi

Additional Conferences (Device Packaging HiTEC HiTEN & CICMT) · 2010 · 16 citations · 4 references

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Abstract

This paper will examine the combined use of both permanent and temporary high-temperature polyimide adhesives used to avoid thin wafer handling. While 3D-TSV technology can improve functionality and performance, adoption of this technology has been delayed by cracking as well as unwanted wafer bowing. This presentation shows means by which a photo-lithographic polyimide adhesive is used in a temporary bonding scheme to eliminate intermediate-stage thinned wafer handling.

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