IEEE Transactions on Nuclear Science · 2011 · 27 citations · 10 references
EngineeringComputer EngineeringElectrical EngineeringFault-tolerant ComputingField-programmable Gate ArraysMicroelectronicsDevice CharacterizationDevice ReliabilityDigital Logic DesignFpga ArchitectureHardware Fault ToleranceTiming AnalysisCircuit Delay ModelingDigital Logic CircuitsFunctional Failure AnalysisLogic Function ImplementationPropagation Delay ModelingRadiation Effects On ReliabilityReliability SimulationSignal Propagation Delay
We exposed a flash-based FPGA to radiation to measure variations in current, temperature, propagation-delay and duty-cycle in logic circuits. Propagation-delay degradations vary from 400% to 1100% before functional failure, according to circuit and logical mapping. Electrical simulations are carried out to study the difference of behavior in the degradation of different logic mappings.
10
Total Ionizing Dose effects in 130-nm commercial CMOS technologies for HEP experiments
L. Gonella, F. Faccio, Marco Silvestri et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2007 · 109 citations
Engineering, Computer Engineering, Electrical Engineering +14