Concepedia

Total Ionizing Dose effects in 130-nm commercial CMOS technologies for HEP experiments

L. Gonella, F. Faccio, Marco Silvestri, Simone Gerardin, D. Pantano, V. Re, M. Manghisoni, L. Ratti, A. Ranieri

Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2007 · 109 citations · 5 references

DOI

Concepts

References

5

Radiation-induced edge effects in deep submicron CMOS transistors

F. Faccio, G. Cervelli · IEEE Transactions on Nuclear Science · 2005 · 412 citations · Full text

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Physics potential and experimental challenges of the LHC luminosity upgrade

F. Gianotti, M. Mangano, T. Virdee et al. · The European Physical Journal C · 2005 · 407 citations · Full text

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Radiation tolerant VLSI circuits in standard deep submicron CMOS technologies for the LHC experiments: practical design aspects

G. Anelli, M. Campbell, M. Delmastro et al. · IEEE Transactions on Nuclear Science · 1999 · 370 citations · Full text

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Noise Performance of 0.13$mu$m CMOS Technologies for Detector Front-End Applications

M. Manghisoni, L. Ratti, V. Re et al. · IEEE Transactions on Nuclear Science · 2006 · 24 citations

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Semiconductor materials and detectors for future very high luminosity colliders

A. Candelori · IEEE Transactions on Nuclear Science · 2005 · 10 citations

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