Concepedia

Single-Event Upset (SEU) Results of Embedded Error Detect and Correct Enabled Block Random Access Memory (Block RAM) Within the Xilinx XQR5VFX130

Gregory R. Allen, Larry D. Edmonds, Chen Wei Tseng, G.M. Swift, C. Carmichael

IEEE Transactions on Nuclear Science · 2010 · 30 citations · 7 references

Concepts

EngineeringComputer EngineeringElectrical EngineeringComputer ArchitectureEmbedded SystemsMicroelectronicsBuilt-in Self-testDesign For TestabilityEmbedded Memory BlocksError DetectionHardware Fault ToleranceMemory Subsystem DesignBlock RamBlock Ram ArchitectureFault-tolerant ArchitectureRandom Access Memory (Ram)Random-access Memory

Abstract

Recent heavy ion measurements of the single-event upset (SEU) cross section for 65 nm embedded block random access memory (Block RAM) are presented. Results of initial investigation into the on-chip Error Detection and Correction (EDAC) are also discussed.

References

7

Radiation-induced multi-bit upsets in SRAM-based FPGAs

Heather Quinn, Paul Graham, Jim Krone et al. · IEEE Transactions on Nuclear Science · 2005 · 159 citations

Engineering, Computer Engineering, Electrical Engineering +17

Effectiveness of Internal Versus External SEU Scrubbing Mitigation Strategies in a Xilinx FPGA: Design, Test, and Analysis

Melanie D. Berg, C. Poivey, David Petrick et al. · IEEE Transactions on Nuclear Science · 2008 · 137 citations

Engineering, Computer Engineering, Electrical Engineering +14

Comparison of Xilinx Virtex-II FPGA SEE sensitivities to protons and heavy ions

R. Koga, J. George, G.M. Swift et al. · IEEE Transactions on Nuclear Science · 2004 · 62 citations

Engineering, Computer Engineering, Computer Science +17

Multiple Bit Upsets and Error Mitigation in Ultra-Deep Submicron SRAMS

D.G. Mavis, Paul Eaton, M. Sibley et al. · IEEE Transactions on Nuclear Science · 2008 · 59 citations

Engineering, Computer Engineering, Electrical Engineering +16

Single Event Upsets in Xilinx Virtex-4 FPGA Devices

J. George, R. Koga, G.M. Swift et al. · 2006 · 54 citations

Engineering, Computer Engineering, Electrical Engineering +12