Chen Wei Tseng

Static Upset Characteristics of the 90nm Virtex-4QV FPGAs

G.M. Swift, Gregory R. Allen, Chen Wei Tseng et al. · 2008 · 37 citations

Engineering, Computer Engineering, Electrical Engineering +13

Correcting Single-Event Upsets in Virtex-II Platform FPGA Configuration Memory

Brendan Bridgford, C. Carmichael, Chen Wei Tseng · 2007 · 33 citations

Engineering, Computer Engineering, Computer Science +15

Single-Event Upset (SEU) Results of Embedded Error Detect and Correct Enabled Block Random Access Memory (Block RAM) Within the Xilinx XQR5VFX130

Gregory R. Allen, Larry D. Edmonds, Chen Wei Tseng et al. · IEEE Transactions on Nuclear Science · 2010 · 30 citations

Engineering, Computer Engineering, Electrical Engineering +14

Single Event Test Methodologies and System Error Rate Analysis for Triple Modular Redundant Field Programmable Gate Arrays

Gregory R. Allen, Larry D. Edmonds, G.M. Swift et al. · IEEE Transactions on Nuclear Science · 2011 · 16 citations

Engineering, Computer Engineering, Electrical Engineering +17

SEU-Susceptibility of Logical Constants in Xilinx FPGA Designs

Heather Quinn, Gregory R. Allen, G.M. Swift et al. · IEEE Transactions on Nuclear Science · 2009 · 10 citations

Engineering, Computer Engineering, Electrical Engineering +17