2007 · 38 citations · 12 references
EngineeringElectrical EngineeringPhysicsCondensed Matter PhysicsElectronic MaterialsSemiconductor DevicesDevice ModelingOhm's LawOxide SemiconductorsPercolation TheorySemiconductor ReliabilityAnalytic GeneralizationOxide BreakdownPercolationPercolation AnalysisPercolation BehaviorPercolation ThresholdsPercolation TransitionWeibull Model
We extend the cell-based approach of Sune to full percolation that is predictive down to 0.4nm. We resolve conflicting reports in the literature on the scaling behavior of the Weibull shape parameter with oxide thickness, and show that Weibull statistics can be violated if pre-existing traps are present.
12
On the breakdown statistics of very thin SiO2 films
J. Suñé, I. Placencia, N. Barniol et al. · Thin Solid Films · 1990 · 256 citations
Natural Sciences, Materials Engineering, Materials Science +10