Concepedia
Thin Solid Films · 1990 · 256 citations · 34 references
Natural SciencesMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials CharacterizationThin FilmsThin Film Electrical PropertiesThin-film DepositionThin-film MaterialsSilica-based MaterialsThin Oxide FilmsThin Oxide LayersThin-film Oxides
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Electrical breakdown in thin gate and tunneling oxides
Ih-Chin Chen, S. Holland, Chenming Hu · IEEE Transactions on Electron Devices · 1985 · 484 citations
Engineering, Electrical Engineering, Physics +17
Dielectric breakdown in electrically stressed thin films of thermal SiO2
E. Harari · Journal of Applied Physics · 1978 · 438 citations
Engineering, Electrical Engineering, Materials Science +17
Modeling and characterization of gate oxide reliability
J.C. Lee, Ih-Chin Chen, Hu Chenming · IEEE Transactions on Electron Devices · 1988 · 370 citations
Trap generation and occupation dynamics in SiO2 under charge injection stress
Y. Nissan‐Cohen, J. Shappir, D. Frohman‐Bentchkowsky · Journal of Applied Physics · 1986 · 207 citations
Engineering, Materials Engineering, Materials Science +16
The maximum dielectric strength of thin silicon oxide films
N. Klein, H. Gafni · IEEE Transactions on Electron Devices · 1966 · 160 citations