X. Aymerich

On the breakdown statistics of very thin SiO2 films

J. Suñé, I. Placencia, N. Barniol et al. · Thin Solid Films · 1990 · 256 citations

Natural Sciences, Materials Engineering, Materials Science +10

Resistive switching in hafnium dioxide layers: Local phenomenon at grain boundaries

Mario Lanza, G. Bersuker, M. Porti et al. · Applied Physics Letters · 2012 · 173 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Electrical characterization of stressed and broken down SiO2 films at a nanometer scale using a conductive atomic force microscope

M. Porti, M. Nafrı́a, X. Aymerich et al. · Journal of Applied Physics · 2002 · 112 citations

Engineering, Materials Engineering, Materials Science +17

Soft breakdown conduction in ultrathin (3-5 nm) gate dielectrics

E. Miranda, J. Suñé, R. Rodrı́guez et al. · IEEE Transactions on Electron Devices · 2000 · 109 citations

Engineering, Electrical Engineering, Materials Science +17

Exploratory observations of post-breakdown conduction in polycrystalline-silicon and metal-gated thin-oxide metal-oxide-semiconductor capacitors

M. Nafrı́a, J. Suñé, X. Aymerich · Journal of Applied Physics · 1993 · 97 citations

Engineering, Electrical Engineering, Materials Science +17