6
Publications
360
Citations
6
H-Index
1988
Active since
I. Placencia is an author at Centro Nacional de Microelectrónica specializing in applied physics, engineering, and nanoelectronics.
Top concepts
EngineeringApplied PhysicsNanoelectronicsMicroelectronicsElectrical InsulationElectrical EngineeringPhysicsThin FilmsMaterial ScienceMaterials Engineering
Publications per year
1988–1990
6
6
On the breakdown statistics of very thin SiO2 films
J. Suñé, I. Placencia, N. Barniol et al. · Thin Solid Films · 1990 · 255 citations
Degradation and Breakdown of Gate Oxides in VLSI Devices
J. Suñé, I. Placencia, N. Barniol et al. · physica status solidi (a) · 1989 · 47 citations
Materials Science, Materials Engineering, Electrical Engineering +15
Nondestructive multiple breakdown events in very thin SiO2 films
J. Suñé, E. Farrés, I. Placencia et al. · Applied Physics Letters · 1989 · 22 citations · Full text
Electrical Engineering, Oxide Conduction States, Engineering +15
On the SiSiO2 interface roughness in VLSIMOS structures
I. Placencia, E. Farréas, N. Barniol et al. · physica status solidi (a) · 1988 · 13 citations
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