Underfill adhesion to BCB (Cyclotene/sup TM/) bumping and redistribution dielectrics

P. Garrou, D. Scheck, Jang‐Hi Im, J. Hetzner, Gregory F. Meyers, David D. Hawn, Jiali Wu, M.B. Vincent, C.P. Wong

IEEE Transactions on Advanced Packaging · 2000 · 11 citations · 6 references

Concepts

Abstract

The adhesion of several commercial underfills (Dexter Hysol FP4511, FP4527, and CNB775-34) to BCB (CYCLOTENE 4022, 4024) has been studied through die shear testing and subsequent failure analysis. Die shear values range between 69-30 MPa. Failure analysis by optical microscopy, profilometry and XPS spectroscopy indicates mixed mode failure at various interfaces. From the die shear data collected before and after 24 h water boil for Cyclotene 4022 and 4024 (with AP3000 adhesion promoter) and underfillers FP 4511 and 4527 we find the die shear strength decreases an average of 11% for the four comparisons. Adhesion promoters based on vinyltriacetoxysilane or 3-amino-propyltriethoxysilane show equivalent die shear performance. Substrate surface cleaning based on UV ozone treatment reveals oxidation of the BCB surface which by SIMS analysis remains <0.1 /spl mu/m deep after 10 min of treatment.

References

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