Transconductance of large grain excimer laser-annealed polycrystalline silicon thin film transistors

Conductivity behavior in polycrystalline semiconductor thin film transistors

J. Levinson, F. R. Shepherd, P. J. Scanlon et al. · Journal of Applied Physics · 1982 · 615 citations

Engineering, Electrical Engineering, Materials Science +17

Fermi Level Position at Metal-Semiconductor Interfaces

Carver Mead, W. G. Spitzer · Physical Review · 1964 · 477 citations

Natural Sciences, Materials Science, Physics +17

Polycrystalline silicon thin film transistors

S. D. Brotherton · Semiconductor Science and Technology · 1995 · 303 citations

Engineering, Materials Engineering, Materials Science +17

Passivation kinetics of two types of defects in polysilicon TFT by plasma hydrogenation

I‐Wen Wu, T.Y. Huang, W. B. Jackson et al. · IEEE Electron Device Letters · 1991 · 244 citations

Engineering, Electrical Engineering, Materials Science +17

Enlargement of Poly-Si Film Grain Size by Excimer Laser Annealing and Its Application to High-Performance Poly-Si Thin Film Transistor

Hiroyuki Kuriyama, Seiichi Kiyama, Shigeru Noguchi et al. · Japanese Journal of Applied Physics · 1991 · 153 citations

Engineering, Materials Engineering, Materials Science +17