G. Kamarinos - Concepedia

Author

G. Kamarinos

Also Known As

G Kamarinos, G. KAMARINOS, G. Kamarinos, G.. Kamarinos, G.Kamarinos, Georges Kamarinos, Georges Kamarinos Georges Kamarinos, Kamarinos, G.

159

Publications

1.6K

Citations

H-Index

Concepts

All Affiliations

Aristotle University of Thessaloniki CEA Grenoble Centre National de la Recherche Scientifique Seiko Holdings (Japan)Epson Information Technology College

About

G. Kamarinos is an author at Aristotle University of Thessaloniki specializing in applied physics, engineering, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	20	48	1.3K
2	Applied Physics	20	46	1.2K
3	Electrical Engineering	20	43	1.1K
4	Computer Engineering	1	1	12
5	Environmental Engineering	1	1	10

G. Kamarinos

Publications

1.3K

Citations

H-Index

Page 1

	Year	Citations
On-current modeling of large-grain polycrystalline silicon thin-film transistors Filippos Farmakis, J. Brini, G. Kamarinos, IEEE Transactions on Electron Devices Device ModelingMaterials EngineeringElectrical EngineeringPolysilicon FilmEngineering	2001	85
Effect of excimer laser annealing on the structural and electrical properties of polycrystalline silicon thin-film transistors Constantinos T. Angelis, C.A. Dimitriadis, M Miyasaka, Journal of Applied Physics Materials ScienceMaterials EngineeringElectrical EngineeringPolysilicon FilmsEngineering	1999	84
A revised analysis of dry oxidation of silicon A. Fargeix, G. Ghibaudo, G. Kamarinos Journal of Applied Physics Materials ScienceSilicon Dry OxidationDerivative PlotsEngineeringOxidation Resistance	1983	83
Study of leakage current in n-channel and p-channel polycrystalline silicon thin-film transistors by conduction and low frequency noise measurements Constantinos T. Angelis, C.A. Dimitriadis, I. Samaras, Journal of Applied Physics Electrical EngineeringEngineeringStress-induced Leakage CurrentBias Temperature InstabilityApplied Physics	1997	74
Anomalous turn-on voltage degradation during hot-carrier stress in polycrystalline silicon thin-film transistors Filippos Farmakis, J. Brini, G. Kamarinos, IEEE Electron Device Letters Electrical EngineeringHot-carrier StressEngineeringNanoelectronicsStress-induced Leakage Current	2001	72
Characterization of traps in the gate dielectric of amorphous and nanocrystalline silicon thin-film transistors by 1/f noise E.G. Ioannidis, A. Tsormpatzoglou, D.H. Tassis, Journal of Applied Physics Electrical EngineeringH TftsEngineeringPhysicsNanoelectronics	2010	43
Effect of grain boundaries on hot-carrier induced degradation in large grain polysilicon thin-film transistors C.A. Dimitriadis, Mutsumi Kimura, M Miyasaka, Solid-State Electronics Electrical EngineeringGrain BoundariesEngineeringBias Temperature InstabilityApplied Physics	2000	39
Contacts of titanium nitride to n- and p-type gallium nitride films C.A. Dimitriadis, Th. Karakostas, S. Logothetidis, Solid-State Electronics Materials ScienceEngineeringP-type GalliumSurface ScienceApplied Physics	1999	39
Characteristics of TiNx/n-Si Schottky diodes deposited by reactive magnetron sputtering C.A. Dimitriadis, J. I. Lee, P. Patsalas, Journal of Applied Physics EngineeringIntegrated CircuitsSilicon On InsulatorSemiconductor DeviceReactive Magnetron Sputtering	1999	37
Hot-carrier-induced degradation in short p-channel nonhydrogenated polysilicon thin-film transistors N. A. Hastas, C.A. Dimitriadis, J. Brini, IEEE Transactions on Electron Devices Electrical EngineeringEngineeringVlsi DesignStress TimeStress-induced Leakage Current	2002	37

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