2003 · 29 citations · 9 references
EngineeringElectrical EngineeringPhysicsMicroelectronicsNuclear PhysicsRadiation PhysicsDevice ReliabilityHeavy-ion PhysicsHigh-dose Radiation EffectsRadiation Damage In MaterialsRadiation HardeningRadiation-resistant MaterialsComponent-level Radiation TestingHeavy Ion RadiationHeavy-ion ReactionsRadiation DamageRadiation Damage EffectsRadiation EffectsRadiation TestingSingle Event Effects
We present heavy ion and proton single event effects (SEE) as well as radiation damage ground test results for candidate spacecraft electronics. Microelectronics tested include digital, analog, and hybrid devices.
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Heavy ion and proton-induced single event multiple upset
Robert A. Reed, Martin A. Carts, Paul W. Marshall et al. · IEEE Transactions on Nuclear Science · 1997 · 103 citations
Total dose and proton damage in optocouplers
B.G. Rax, C.I. Lee, A.H. Johnston et al. · IEEE Transactions on Nuclear Science · 1996 · 81 citations