Statistics
Publications
2
Citations
84
H-Index
2
Active since
2000
Affiliations
H.S. Kim is an author at Jackson and Tull (United States) specializing in device reliability, radiation damage in materials, and radiation damage effects.
Publications per year
2000–2003
2
2
Recent radiation damage and single event effect results for microelectronics
Martha V. O'Bryan, Kenneth A. LaBel, Robert A. Reed et al. · 2003 · 29 citations
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