IEEE Transactions on Electron Devices · 2003 · 30 citations · 13 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsOptoelectronicsSemiconductor DevicesDetector TechnologyPhotodetectorsSemiconductor DetectorsAvalanche PhotodiodesDark Current ReductionHeterojunction PhotodetectorsIntegrated PhotodetectorsPhotodiodesQuantum Well PhotodetectorsSulfur Passivation
It is shown in this work that sulfur passivation followed by a deionized water rinse reduces the dark current of InGaAs-InP PIN photodetectors significantly. This reduction in dark current is shown to be due to reduced recombination at the exposed mesa surface. Detectors with polyimide capping after sulfur passivation showed no degradation in characteristics with time.
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Haruhiro Oigawa, Jia-Fa Fan, Yasuo Nannichi et al. · Japanese Journal of Applied Physics · 1991 · 247 citations
Natural Sciences, Materials Engineering, Materials Science +17
M. S. Carpenter, M. R. Melloch, Mark Lundstrom et al. · Applied Physics Letters · 1988 · 192 citations · Full text
Sulfur as a surface passivation for InP
R. Iyer, R. Chang, D. L. Lile · Applied Physics Letters · 1988 · 145 citations