Concepedia

Laser cross section measurement for the evaluation of single-event effects in integrated circuits

V. Pouget, F. Darracq, A. Touboul

Microelectronics Reliability · 2000 · 28 citations · 3 references

DOI

Concepts

References

3

Correlation of picosecond laser-induced latchup and energetic particle-induced latchup in CMOS test structures

Steven C. Moss, S. D. LaLumondiere, J. Scarpulla et al. · IEEE Transactions on Nuclear Science · 1995 · 107 citations

, , +13

Pulsed laser-induced single event upset and charge collection measurements as a function of optical penetration depth

Joseph S. Melinger, Dale McMorrow, A.B. Campbell et al. · Journal of Applied Physics · 1998 · 85 citations

, , +15

Validation of radiation hardened designs by pulsed laser testing and SPICE analysis

V. Pouget, D. Lewis, H. Lapuyade et al. · Microelectronics Reliability · 1999 · 37 citations

, , +8