Solid-State Electronics · 2003 · 92 citations · 17 references
EngineeringElectrical EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesCmos Circuit DesignCurrent-voltage CharacteristicsDielectricsMemory DevicesMemory Hierarchy DesignMemory Subsystem DesignHigh-k Dielectric IntegrationHigh-k Dielectric ScalingHigh-k DielectricsLow-power Memory CircuitsLow-voltage Cmos DesignMemory Circuit DesignNon-volatile Cmos Memory
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Trap-assisted tunneling in high permittivity gate dielectric stacks
Michel Houssa, M. Tuominen, M. Naili et al. · Journal of Applied Physics · 2000 · 353 citations
Energy gap and band alignment for (HfO2)x(Al2O3)1−x on (100) Si
H.Y. Yu, Meng Li, B. J. Cho et al. · Applied Physics Letters · 2002 · 316 citations