M. Naili

Trap-assisted tunneling in high permittivity gate dielectric stacks

Michel Houssa, M. Tuominen, M. Naili et al. · Journal of Applied Physics · 2000 · 352 citations

Semiconductors, Trap-assisted Tunneling, Electrical Engineering +13

Charge trapping in very thin high-permittivity gate dielectric layers

Michel Houssa, A. Stesmans, M. Naili et al. · Applied Physics Letters · 2000 · 78 citations

Materials Science, Electrical Engineering, Semiconductor Device +11

Effect of O₂post-deposition anneals on the properties of ultra-thin SiO_<i>x</i>/ZrO₂gate dielectric stacks

Michel Houssa, M. Naili, Chao Zhao et al. · Semiconductor Science and Technology · 2000 · 78 citations

Materials Science, Electrical Engineering, Epitaxial Growth +11

Unsupervised GAN-Based Intrusion Detection System Using Temporal Convolutional Networks and Self-Attention

Paulo Freitas de Araujo-Filho, M. Naili, Georges Kaddoum et al. · IEEE Transactions on Network and Service Management · 2023 · 69 citations

Constant voltage stress induced degradation in HfO2/SiO2 gate dielectric stacks

Zhen Xu, Michel Houssa, Richard Carter et al. · Journal of Applied Physics · 2002 · 67 citations

Electrical Engineering, Defect Generation, Engineering +11