Publication | Closed Access
Parameter Extraction from Spaceborne MOSFETs
10
Citations
6
References
1985
Year
Device ModelingElectrical EngineeringParameter IdentificationEngineeringVlsi DesignPhysical Design (Electronics)Parameter ExtractionCmos Transistors21-Mosfet ParametersBias Temperature InstabilityComputer EngineeringAddressable MatrixCircuit SimulationComputational ElectromagneticsMicroelectronicsElectromagnetic Compatibility
An addressable matrix of 32 CMOS transistors was designed into a test chip to be flown on the Combined Release and Radiation Effects Satellite (CRRES). In this paper the matrix is described along with a SPICE-like parameter extraction procedure called JMOSFIT, and Cobalt 60 radiation test results are presented that illustrate the shift in the 21-MOSFET parameters derived from JMOSFIT.
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