Applied Physics Letters · 1991 · 16 citations · 7 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsMaterials ChemistrySemiconductor MaterialsCarrier TransportChemical Vapor DepositionDopingSemiconductor Crystal GrowthSemiconductor InterfacesSemiconductor PhysicsDiffusion ProfilesDopant IncorporationDoped SemiconductorsDoping ProfilesMetal-organic Chemical Vapor DepositionMetalorganic Chemical Vapor DepositionSemiconductor DopingSemiconductor Doping Profiles
Deposition of InP by metalorganic chemical vapor deposition, simultaneously doped with both a donor (Si) and an acceptor (Zn) species during the growth, has been carried out. The incorporation of Si is not affected by the presence of Zn, but the Zn incorporation is substantially enhanced by the presence of Si. These results are consistent with the formation of donor-acceptor pairs, which has been suggested earlier to explain Zn diffusion profiles in Si-doped InP.
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Point defects and dopant diffusion in silicon
P. Fahey, Peter B. Griffin, J.D. Plummer · Reviews of Modern Physics · 1989 · 1.4K citations
Indium-defect complexes in silicon studied by perturbed angular correlation spectroscopy
Th. Wichert, M. Deicher, G. Gr�bel et al. · Applied Physics A · 1989 · 107 citations