Characterization of an AlN buffer layer and a thick-GaN layer grown on sapphire substrate by MOCVD

S. Çörekçí, Mustafa Kemal Öztürk, A. Bengi, M. Çakmak, Süleyman Özçelik, Ekmel Özbay

Journal of Materials Science · 2010 · 17 citations · 50 references

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