S. Çörekçí

Structural, morphological, and optical properties of AlGaN/GaN heterostructures with AlN buffer and interlayer

S. Çörekçí, Mustafa Kemal Öztürk, Barış Akaoğlu et al. · Journal of Applied Physics · 2007 · 40 citations

Engineering, Materials Engineering, Materials Science +17

Strain–Stress Analysis of AlGaN/GaN Heterostructures With and Without an AlN Buffer and Interlayer

Mustafa Kemal Öztürk, Halit Altuntaş, S. Çörekçí et al. · Strain · 2010 · 24 citations

Engineering, Materials Engineering, Materials Science +17

The influence of thickness and ammonia flow rate on the properties of AlN layers

S. Çörekçí, Mustafa Kemal Öztürk, M. Çakmak et al. · Materials Science in Semiconductor Processing · 2011 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +12

Effects of Thermal Annealing and Film Thickness on the Structural and Morphological Properties of Titanium Dioxide Films

S. Çörekçí, K. Kızılkaya, T. Asar et al. · Acta Physica Polonica A · 2012 · 20 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +16

Characterization of an AlN buffer layer and a thick-GaN layer grown on sapphire substrate by MOCVD

S. Çörekçí, Mustafa Kemal Öztürk, A. Bengi et al. · Journal of Materials Science · 2010 · 17 citations

Engineering, Materials Engineering, Materials Science +16