IEEE Micro · 2003 · 616 citations · 14 references
EngineeringComputer EngineeringElectrical EngineeringFault ToleranceMicroelectronicsVlsi DesignBuilt-in Self-testDevice ReliabilityHardware Fault ToleranceIntegrated Circuit DesignReliable System DesignSemiconductor ReliabilityCmos ReliabilityFault Tolerance In Digital CircuitsFault-tolerant ArchitectureInterconnect ReliabilityLeakage Recovery TechniquesReliability DegradationReliability Degradation MechanismsTransient Fault Modeling
Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.
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Impact of CMOS process scaling and SOI on the soft error rates of logic processes
S.A. Hareland, J. Maiz, M. Alavi et al. · 2002 · 120 citations
Engineering, Computer Engineering, Electrical Engineering +17