2010 · 64 citations · 5 references
EngineeringComputer EngineeringElectrical EngineeringFault ToleranceFault-tolerant ComputingMicroelectronicsClock ManagementDevice ReliabilityHardware Fault ToleranceIntegrated Circuit DesignProcessor Core DesignProcessor MicroarchitectureError Detection CircuitsFault-tolerant Processor DesignProcess Variation RobustnessProcess Variation ToleranceResilient Computer ArchitectureRobustness Against Random VariationsSiliconThroughput
A 45 nm 1.3 GHz microprocessor core employs error-detection circuits, tunable replica circuits, and error-recovery circuits, to mitigate dynamic variation guardbands for maximum throughput. An adaptive clock controller adjusts the frequency based on error statistics to optimize efficiency. Silicon measurements show resilient operation as well as throughput gains of 12 to 16% at 1.0 V and 22 to 23% at 0.8 V.
5
On-line delay testing of digital circuits
P. Franco, E.J. McCluskey · 2002 · 79 citations
Engineering, Computer Engineering, Electrical Engineering +14