Microelectronic Engineering · 2009 · 52 citations · 18 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesCmos Circuit DesignIntegrated Circuit DesignLeakage Power ReductionShort-channel EffectsDevice OptimizationFin Field-effect TransistorsLeakage Current Reduction
18
FinFET-a self-aligned double-gate MOSFET scalable to 20 nm
Chenming Hu, Jeffrey Bokor, Tsu‐Jae King et al. · IEEE Transactions on Electron Devices · 2000 · 1.6K citations
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Xuejue Huang, Wen‐Chin Lee, C. Kuo et al. · IEEE Transactions on Electron Devices · 2001 · 283 citations
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