Microelectronics Reliability · 2011 · 26 citations · 23 references
EngineeringAerospace EngineeringSafety EngineeringDurability TestingImpact MechanicsReliabilityShock WavesStress TestingTest ReliabilityAccelerated Life TestingFailure Criteria Under ShockFailure Mechanisms Under ImpactMaterial Failure Under ImpactMechanical Shock TestingShock QualificationShock ReliabilityShock Testing
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Effect of the drop impact on BGA/CSP package reliability
Kinuko Mishiro, Shigeo Ishikawa, Mitsunori Abe et al. · Microelectronics Reliability · 2002 · 103 citations
Drop impact survey of portable electronic products
Chwee Teck Lim, C.W. Ang, Long Bin Tan et al. · 2004 · 102 citations
Natural Sciences, Electrical Engineering, Mechanical Behavior Of Materials +16
Modal analysis and dynamic responses of board level drop test
Jing-en Luan, Tong Yan Tee, E. Pek et al. · 2004 · 90 citations
Natural Sciences, Electrical Engineering, Materials Science +17