Characterization of high-voltage IGBT module degradations under PWM power cycling test at high ambient temperature

Selected failure mechanisms of modern power modules

Mauro Ciappa · Microelectronics Reliability · 2002 · 955 citations

Reliability, Electrical Engineering, Reliability Engineering +6

On the effect of power cycling stress on IGBT modules

P. Cova, F. Fantini · Microelectronics Reliability · 1998 · 81 citations

Electrical Engineering, Engineering, Power Device +3

Degradation behavior of 600V–200A IGBT modules under power cycling and high temperature environment conditions

Mohamed Elkarim Bouarroudj, Zoubir Khatir, J.P. Ousten et al. · Microelectronics Reliability · 2007 · 75 citations · Full text

Electrical Engineering, Power Cycling, Engineering +9

Fast power cycling test for insulated gate bipolar transistor modules in traction application

Martin Held, P. Jacob, G. Nicoletti et al. · International Journal of Electronics · 1999 · 75 citations

Engineering, Descriptive Model, Traction Application +16

Advanced IGBT modules for railway traction applications: Reliability testing

H. Berg, E. Wolfgang · Microelectronics Reliability · 1998 · 63 citations

Reliability, Advanced Igbt Modules, Electrical Engineering +6