Degradation behavior of 600V–200A IGBT modules under power cycling and high temperature environment conditions - Concepedia

Concepedia

Publication | Open Access

Degradation behavior of 600V–200A IGBT modules under power cycling and high temperature environment conditions

DOI Full Paper Access

75

Citations

10

References

2007

Year

Mohamed Elkarim Bouarroudj, Zoubir Khatir, J.P. Ousten, F. Badel, Laurent Dupont, Stéphane Lefebvre

Microelectronics Reliability

Electrical EngineeringPower CyclingEngineeringHardware ReliabilityHigh Voltage EngineeringPower DeviceIgbt ModulesDegradation BehaviorPower Electronic SystemsPower ElectronicsDevice ReliabilityMicroelectronics

References

	Year	Citations

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