Concepedia

Author

Mauro Ciappa

ETH Zurich

Also Known As

Ciappa, Mauro, M Ciappa, M. Ciappa, MAURO CIAPPA, Mauro Ciappa

157

Publications

3K

Citations

23

H-Index

69

Concepts

All Affiliations

ETH ZurichÉcole Polytechnique Fédérale de LausanneAlstom (France)Infineon Technologies (Germany)Infineon Technologies (Austria)
MC

About

Mauro Ciappa is an author at ETH Zurich specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#ConceptH-IndexPublicationsCitations

1

Engineering

22

40

2.5K

2

Applied Physics

14

18

526

3

Education

2

2

105

4

Natural Sciences

2

2

86

5

Management

1

1

55

Mauro Ciappa

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45

Publications

2.6K

Citations

22

H-Index

YearCitations

Selected failure mechanisms of modern power modules

Mauro Ciappa

Microelectronics Reliability

2002

955

Thermal component model for electrothermal analysis of IGBT module systems

Chan-Su Yun, P. Malberti, Mauro Ciappa,

IEEE Transactions on Advanced Packaging

2001

147

Lifetime prediction and design of reliability tests for high-power devices in automotive applications

Mauro Ciappa, F. Carbognani, Wolf Fïchtner

IEEE Transactions on Device and Materials Reliability

2003

146

Lifetime prediction of IGBT modules for traction applications

Mauro Ciappa, Wolf Fïchtner

2002

102

New technique for the measurement of the static and of the transient junction temperature in IGBT devices under operating conditions

D. Barlini, Mauro Ciappa, Alberto Castellazzi,

Microelectronics Reliability

2006

90

Assessing the performance of two-dimensional dopant profiling techniques

Natasja Duhayon, Pierre Eyben, Marc Fouchier,

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena

2004

67

Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal Simulation of IGBT Modules in Hybrid Electric Vehicles

Mauro Ciappa, Wolf Fïchtner, Takashi Kojima,

Microelectronics Reliability

2005

64

Measurement of the transient junction temperature in MOSFET devices under operating conditions

D. Barlini, Mauro Ciappa, Michel Mermet-Guyennet,

Microelectronics Reliability

2007

62

Monte Carlo modeling in the low-energy domain of the secondary electron emission of polymethylmethacrylate for critical-dimension scanning electron microscopy

Mauro Ciappa

Journal of Micro/Nanolithography MEMS and MOEMS

2010

62

A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle Fatigue Failure Mechanisms in Power Semiconductors

Mauro Ciappa, F. Carbognani, P. Cova,

Microelectronics Reliability

2002

56

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