Publication | Closed Access
Lifetime prediction and design of reliability tests for high-power devices in automotive applications
146
Citations
4
References
2003
Year
EngineeringSystem LifetimeLife PredictionMechanical EngineeringThermal CyclesPower ElectronicsLifetime PredictionReliability EngineeringReliability TestingHigh-power DevicesSystems EngineeringStatistical DistributionReliability TestsService Life PredictionReliabilityElectrical EngineeringHardware ReliabilityStructural Health MonitoringReliability PredictionDevice ReliabilityLow-cycle FatiguePhysic Of FailureCircuit ReliabilityThermal EngineeringMechanics Of Materials
Different procedures are defined and compared to extract the statistical distribution of the thermal cycles experienced by power devices that are installed in hybrid vehicles and operated according to arbitrary mission profiles. This enables both to design efficient accelerated tests tailored on realistic data and to provide the input for lifetime prediction models. Initially, the system lifetime is predicted under the assumption of linear accumulation of the damage produced by low cycling fatigue. Also, a novel prediction model based on some fundamental equations is introduced which takes into consideration the creep experienced by compliant materials when they are submitted to thermal cycles.
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