Application of various optical techniques for ESD defect localization

Time-resolved optical characterization of electrical activity in integrated circuits

J. C. Tsang, J. A. Kash, David P. Vallett · Proceedings of the IEEE · 2000 · 27 citations

Engineering, Computer Engineering, Electrical Engineering +17

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC

V. Pouget, D. Lewis, P. Fouillat · 2004 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +17

ESD induced latent defects in CMOS ICs and reliability impact

Nicolas Guitard, David Trémouilles, S. Alves et al. · 2004 · 11 citations

Engineering, Electrical Engineering, Analog Electronics +16