Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC

Abstract

This paper presents an experimental system for integrated circuits testing with a pulsed laser beam. The system is fully automated and simultaneously provides interesting spatial and temporal resolutions for various applications like fault injection, radiation sensitivity evaluation, or default localization. In the presented application, the system is used to visualize signal propagation in an 8 bit half-flash ADC.