Determination of twist angle of in-plane mosaic spread of GaN films by high-resolution X-ray diffraction

Role of threading dislocation structure on the x-ray diffraction peak widths in epitaxial GaN films

B. Heying, Xuemei Wu, S. Keller et al. · Applied Physics Letters · 1996 · 825 citations

Materials Science, Dislocation Densities, Epitaxial Growth +12

Defect structure of epitaxial GaN films determined by transmission electron microscopy and triple-axis X-ray diffractometry

T. Metzger, R. Höpler, E. Born et al. · Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties · 1998 · 547 citations

Materials Science, Dislocation Densities, Electrical Engineering +14

The estimation of dislocation densities in metals from X-ray data

Peter Gay, P. B. Hirsch, Anthony E. Kelly · Acta Metallurgica · 1953 · 513 citations

Materials Science, Materials Engineering, Dislocation Densities +10

Mosaic structure in epitaxial thin films having large lattice mismatch

V. Srikant, James S. Speck, David R. Clarke · Journal of Applied Physics · 1997 · 445 citations

Materials Science, Materials Engineering, Ii-vi Semiconductor +14

X-ray diffraction analysis of the defect structure in epitaxial GaN

H. Heinke, V. Kirchner, S. Einfeldt et al. · Applied Physics Letters · 2000 · 323 citations

Materials Science, Materials Engineering, Wide-bandgap Semiconductor +14